2019 - 2020

0581-5332-01
  Scanning Electron Microscopy  
FACULTY OF ENGINEERING | FACULTY OF ENGINEERING
Barkay ZahavaEngineering Studies - Classrooms205 Sun1500-1700 Sem  2
 
 
University credit hours:  2.0

Course description

Credit Points: 2
Background to scanning electron microscopy (SEM). Electron-specimen interaction: models for elastic and inelastic interaction, Monte-Carlo simulation for electron-specimen interaction. Properties of main signals and X-ray microanalysis. Electron optics: electron sources, magnetic lenses and aberrations. Principles of image formation. Various SEM types including ESEM and advanced methods including Electron Backscattered Diffraction. Practical SEM aspects and various applications.

Note: the SEM laboratory course follows the SEM course and takes place at the third part of the semester.

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